SiMPore Introduces New Nanometer Thick TEM Windows for High-Resolution Imaging of Nanoscale Materials
Features of SiMPore’s UltraSM® TEM Windows:
- 9 and 15 nm thick imaging windows
- Continuous or porous windows
- Pore sizes ranging from 5 to 50 nm
- Pure silicon composition
Unique Benefits of UltraSM® TEM Windows
- Simple and stable suspension of nanoscale materials across the pores for background-free imaging
- A convenient internal calibration signal for materials analysis studies
- Remarkable stability at high beam currents and high annealing temperatures
- Vigorous plasma cleaning of samples
- Easy preparation of aqueous samples due to a hydrophilic surface